Ellipsiz Reliability Testing & Services


Ellipsiz DSS also a service provider for material analysis, failure analysis and reliability testing. Our partners has one of the most advanced analytical tool including field emission transmission electron microscopes (FE-TEM) which is equipped with the capability for various analytical functions (EDX, EELS, HAADF), Focused Ion Beams (FIB) circuit editing and cross-sectioning, SIMS (magnetic sector, quadrupole), X-ray photoelectron spectroscopes (XPS) for organic and inorganic composition analysis and field emission scanning electron microscopes (FE-SEM).

Failure Analysis (FA) and Reliability Testing (RT)
Auto Metrology Service Thickness measurement of epitaxial layers in LED QW structure
Application in Advanced IC, FinFET, process development
Electrical Failure Analysis Decap / Delayer
I-V measurement
Thermal Emission Microscope
Nano Probing
FIB Analysis Dual Beam FIB – Helios NanoLab 660
Dual Beam Plasma FIB, Helios P-FIB
Non-destructive Analysis OM(Optical Microscope)
OP(Optical Profiler)
X-ray Examine
SAT(Scanning Acoustic Tomography)
Ultra-High Resolution 3D X-ray Microscope
Ultra High Resolution 3D Optical Microscope
Time Domain Reflectometry (TDR)
High Resolution SAT
Material Analysis Sample preparation
TEM (Transmission Electron Microscope)
SEM (Scanning Electron Microscopy)
TEM for Liquid Sample Analysis(K-Kit)
Surface Analysis SIMS(Secondary Ion Mass Spectrometry)
High Resolution XRD Service
Field Emission Auger Electron Spectroscopy (FE-AES) Service
Scanning Capacitance Microscopy Service
Spreading Resistance Probe (SRP)
Packaging / Bonding
ESD Testing & Design Service
Reliability Testing
Benchmark Analysis IC Imaging
Benchmark Analysis
Project Service
Tools For Sale

For more information, please feel free to drop us an email at info@ellipsiz.com

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